Scanning Probe Microscopy Investigation of Metal Oxides Nanocrystalline

Scanning probe microscopy techniques (SPM) have been applied to a rapidly improvement in the characterization of metal oxide nanocrystalline. These materials are widely used in photon-to-electricity conversion devices, such as dye-sensitized solar cells. The surface properties of such nanocrystalline determine the devices’ performance. SPM imaging of nanocrystal surfaces and nanoscale systems has demonstrated great potential for new advances in science and technology of renewable energy production. With the invention and recent development of the scanning tunnelling microscope, atomic force microscope, and scanning electrochemical microscopy used in the ultrasensitive non-contact mode, the door has now been opened to detailed studies of the whole range of insulating metal oxide surfaces, and result in new and challenging issues, especially within the field of heterogeneous catalysis. In this chapter, the basic principles of SPM and its characterization of the interface between nanocrystalline and various mediators in the atomic-scale are reviewed with respect to their structure and the charge transfer dynamics.